CeNS Center for NanoScience LMU Ludwig-Maximilians-Universität München
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Christian Westermeier


Curriculum Vitae

Since 2010

PhD student in the group of PD Dr. Bert Nickel, LMU Munich

2009 – 2010

Diploma Thesis in the group of PD Dr. Bert Nickel, LMU Munich

Topic of Diploma Thesis: ”Orts- und zeitaufgelöste Photostrommessungen an organischen Dünnschichttransistoren” (“Spatially and time resolved photoresponse measurements of organic thin film transistors”)

2007 – 2010

Studies in Physics at the LMU Munich

2006 - 2007

Erasmus student at the University of Surrey, Guildford (UK)

2004 - 2007

Physics studies (Vordiplom 2006) at the Ruhr-Universität Bochum

2003 - 2004

Medical studies at the Ruhr-Universität Bochum



Since 2010

Scholarship of the IDK-NBT (Elite Network of Bavaria)

Since 2008

e-fellows.net scholarship

2006 - 2007

Erasmus Scholarship

Research Project

Organic thin films of small aromatic molecules exhibit semiconductor properties which make them promising candidates for innovative electronic devices, such as organic field-effect transistors (OFET), photovoltaics (OPV) or light emitting diodes (OLED). We employ thermal deposition techniques in ultra high vacuum, the most controlled way of producing thin films. The morphology of these thin films such as grain orientation, grain size distribution and dislocation densities are supposed to influence the electronic properties substantially. Thus, a main focus of our work is to correlate structural aspects with electronic transport properties.

The primary objective of my PhD project is local characterization of micro- and nanostructured p- and n-conducting organic layers by imaging with a focused laser beam. For this purpose, we use local illumination by laser scanning techniques with submicron resolution to measure the spatially resolved photoresponse, reflection, luminescence and micro-Raman scattering. These local investigations are performed on thin films and heterojunctions arising from self organization of laterally processed organic materials in a field-effect transistor geometry. The gained results help to understand the crucial relation between the real structure and optoelectronic properties of organic thin films and their emerging interfaces.