CeNS Center for NanoScience LMU Ludwig-Maximilians-Universität München
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Dr. rer. nat. Tom Sobey


Curriculum Vitae

since 2011

Postdoctoral research in the group of Dr. Till Böcking, The University of New South Wales

2010 - 2011

Consultant at Altran Group Germany

2006 - 2010

Doctoral Thesis at the LMU München
Supervisor: Prof. Friedrich Simmel, TU Munich

2005 - 2006

Business Analyst, Maritime Platforms Division, Defence Science
and Technology Organisation (government defence
2300 staff), Melbourne, Australia

2004 - 2005

Research Assistant, Centre for Quantum Computer Technology,
Australia (Australian Research Council
Centre of Excellence)


Summer Semester at the University of Bonn, Germany

1999 - 2004

Bachelor of Science with First Class Honours (Physics) and Bachelor of Commerce (Finance), University of New South Wales, Sydney, Australia


Self-assembly of Artificial DNA
Nano and Microscale Motifs

Dissertation, LMU Munich (2010) Thesis...


T. L. Sobey, S. Renner, F. C. Simmel: 
"Protocols for self-assembly and imaging of DNA nanostructures"
Submitted book chapter, Humana Press.

C. Steinhauer, R. Jungmann, T. Sobey, F. C. Simmel, P. Tinnefeld:
"DNA Origami as a Nanoscopic Ruler for Super-Resolution Microscopy"
Angewandte Chemie International Edition, 48, 8870-8873 (2009).

T. L. Sobey, S. Renner, F. C. Simmel:  
"Assembly and melting of DNA nanotubes from single-sequence tiles"
Journal of Physics Condensed Matter,  21,  034112 (2009).


R. Jungmann, T. Liedl, T. L. Sobey, W. Shih, and F. C. Simmel:
Isothermal assembly of DNA origami structures using denaturing agents"
Journal of the American Chemical Society,  130,  10062-10063 (2008).

T. Liedl, T. L. Sobey, et al.:
"DNA-based nanodevices"
Nano Today, 2007. 2(2): p. 36-41.


T. L. Sobey, S. Renner, F. C. Simmel: 
"Microcharacterization of semiconductor device materials using Kelvin Probe Microscopy"
Microscopy and Microanalysis,  13,  188 (2007).

C. E. Yasin, T. L. Sobey, et al.:
"Interaction correction to the longitudinal conductivity and Hall resistivity in high-quality two-dimensional GaAs electron and hole systems"

Physical Review B 72(24) (2005).